Hook up pin in dft
Specific requirements and special consideration for the Internet of Things within an Industrial settiong. Also known as the Internet of Everything, or IoE, the Internet of Things is a global application where devices can connect to a host of other devices, each either providing data from sensors, or containing actuators that can control some function. Data can be consolidated and processed on mass in the Cloud. An approach in which machines are trained to favor basic behaviors and outcomes rather than explicitly programmed to do certain tasks. That results in optimization of both hardware and software to achieve a predictable range of results.
Microelectromechanical Systems are a fusion of electrical and mechanical engineering and are typically used for sensors and for advanced microphones and even speakers. The ability of a lithography scanner to align and print various layers accurately on top of each other. Special flop or latch used to retain the state of the cell when its main power supply is shut off. Design verification that helps ensure the robustness of a design and reduce susceptibility to premature or catastrophic electrical failures. Additional logic that connects registers into a shift register or scan chain for increased test efficiency.
Sensors are a bridge between the analog world we live in and the underlying communications infrastructure. When channel lengths are the same order of magnitude as depletion-layer widths of the source and drain, they cause a number of issues that affect design. A class of attacks on a device and its contents by analyzing information using different access methods. A system on chip SoC is the integration of functions necessary to implement an electronic system onto a single substrate and contains at least one processor.
A type of transistor under development that could replace finFETs in future process technologies. The Unified Coverage Interoperability Standard UCIS provides an application programming interface API that enables the sharing of coverage data across software simulators, hardware accelerators, symbolic simulations, formal tools or custom verification tools. The basic architecture for most computing today, based on the principle that data needs to move back and forth between a processor and memory.
[DFT] Scan Inertion Issues in DFT Compiler
Description Design for test DFT is also important in low-power design. Tags DFT power clock gating controllability observability. Bugs That Kill Published on August 23, Does Power Verification Work? Published on April 16, A brief history of design We start with schematics and end with ESL. A brief history of logic simulation Important events in the history of logic simulation.
A brief history of logic synthesis Early development associated with logic synthesis. Acronyms Commonly and not-so-commonly used acronyms. Advanced Smart Fill At newer nodes, more intelligence is required in fill because it can affect timing, signal integrity and require fill for all layers. Advanced Packaging A collection of approaches for combining chips into packages, resulting in lower power and lower cost. Agile Development Agile development methodologies. Agile hardware development How Agile applies to the development of hardware systems.
Air Gap A way of improving the insulation between various components in a semiconductor by creating empty space. Ambient Intelligence A collection of intelligent electronic environments. Analog Semiconductors that measure real-world conditions. Analog Design and Verification The design and verification of analog components. Architectural Power Issues Power reduction at the architectural level. Artificial Intelligence AI Using machines to make decisions based upon stored knowledge and sensory input.
Assertion Code that looks for violations of a property. Automatic Test Pattern Generation The generation of tests that can be used for functional or manufacturing verification.
Avalanche Noise Noise in reverse biased junctions. AVM Verifciation methodology created by Mentor. Biometrics Security based on scans of fingerprints, palms, faces, eyes, DNA or movement. Blech effect A reverse force to electromigration. Bluetooth Low Energy Also known as Bluetooth 4. Bus Functional Model Interface model between testbench and device under test. CAN bus Automotive bus developed by Bosch. Cell-Aware Test Fault model for faults within cells. Checker Testbench component that verifies results. Chip Design Design is the process of producing an implementation from a conceptual form.
Chip Design and Verification The design, verification, implementation and test of electronics systems into integrated circuits. Clock Domain Crossing Asynchronous communications across boundaries. Clock Gating Dynamic power reduction by gating the clock.
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Clock Tree Optimization Design of clock trees for power reduction. Cobalt Cobalt is a ferromagnetic metal key to lithium-ion batteries. Code Coverage Metrics related to about of code executed in functional verification. Combinatorial Equivalence Checking Verify functionality between registers remains unchanged after a transformation. Compiled-code Simulation Faster form for logic simulation.
Contact The structure that connects a transistor with the first layer of copper interconnects. Convolutional Neural Network A technique for computer vision based on machine learning. Coverage Completion metrics for functional verification. Crosstalk Interference between signals. Crypto processors Crypto processors are specialized processors that execute cryptographic algorithms within hardware. Dark Silicon A method of conserving power in ICs by powering down segments of a chip when they are not in use.
De Facto Standards A standard that comes about because of widespread acceptance or adoption.
Debug The removal of bugs from a design. Deep Learning DL Deep learning is a subset of artificial intelligence where data representation is based on multiple layers of a matrix. Design for Manufacturing DFM Actions taken during the physical design stage of IC development to ensure that the design can be accurately manufactured.
Design for Test DFT Techniques that reduce the difficulty and cost associated with testing an integrated circuit. Design Patent Protection for the ornamental design of an item. Design Rule Checking DRC A physical design process to determine if chip satisfies rules defined by the semiconductor manufacturer. Design Rule Pattern Matching Locating design rules using pattern matching techniques. Device Noise Sources of noise in devices.
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Diamond Semiconductors A wide-bandgap synthetic material. Digital Circuits Creation of integrated circuits using digital logic. Digital Oscilloscope Allowed an image to be saved digitally. Double Patterning A patterning technique using multiple passes of a laser. Double Patterning Methodologies Colored and colorless flows for double patterning. Dynamic Random Access Memory Single transistor memory that requires refresh. Educational Establishments Educational establishments from which technology has been spawned into the EDA field. Electromigration Electromigration EM due to power densities.
Semiconductor Engineering DFT and Clock Gating
Emulation Special purpose hardware used for logic verification. Energy Harvesting Capturing energy from the environment. Environmental Noise Noise caused by the environment. Epitaxy A method for growing or depositing mono crystalline films on a substrate. Fan-Outs A way of including more features that normally would be on a printed circuit board inside a package. Fault Simulation Evaluation of a design under the presence of manufacturing defects. Femtocells The lowest power form of small cells, used for home WiFi networks.
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Fill The use of metal fill to improve planarity and to manage electrochemical deposition ECD , etch, lithography, stress effects, and rapid thermal annealing. FinFET A three-dimensional transistor. Flash Memory non-volatile, erasable memory. Flicker Noise Noise related to resistance fluctuation.
Formal Verification Formal verification involves a mathematical proof to show that a design adheres to a property. FPGA Reprogrammable logic device. Functional Coverage Coverage metric used to indicate progress in verifying functionality. Functional Design and Verification Functional Design and Verification is currently associated with all design and verification functions performed before RTL synthesis. Functional Verification Functional verification is used to determine if a design, or unit of a design, conforms to its specification.
Gate-Level Power Optimizations Power reduction techniques available at the gate level. Generation-Recombination Noise noise related to generation-recombination.
taihartentki.cf Guard Banding Adding extra circuits or software into a design to ensure that if one part doesn't work the entire system doesn't fail. Hardware Assisted Verification Use of special purpose hardware to accelerate verification. Hardware Modeler Historical solution that used real chips in the simulation process.